Institut Néel, UPR 2940, CNRS-Université Joseph Fourier, 25, rue des Martyrs, 38000 Grenoble, France.
Phys Rev Lett. 2013 May 24;110(21):213901. doi: 10.1103/PhysRevLett.110.213901. Epub 2013 May 21.
We show that, contrary to the common wisdom, surface plasmon poles are not involved in the imaging process in leakage radiation microscopy. Identifying the leakage radiation modes directly from a transverse magnetic potential leads us to reconsider the surface plasmon field and unfold the nonplasmonic contribution to the image formation. While both contributions interfere in the imaging process, our analysis reveals that the reassessed plasmonic field embodies a pole mathematically similar to the usual surface plasmon pole. This removes a long-standing ambiguity associated with plasmonic signals in leakage radiation microscopy.
我们证明,与普遍的观点相反,在泄漏辐射显微镜中,表面等离激元极点并不参与成像过程。通过直接从横向磁位识别泄漏辐射模式,我们重新考虑了表面等离激元场,并揭示了对图像形成的非等离激元贡献。虽然这两个贡献在成像过程中相互干扰,但我们的分析表明,重新评估的等离激元场包含一个与通常的表面等离激元极点在数学上相似的极点。这消除了与泄漏辐射显微镜中的等离激元信号相关的一个长期存在的模糊性。