基于泄漏辐射显微镜的离焦平面成像
Out-of-Focal Plane Imaging by Leakage Radiation Microscopy.
作者信息
Zhu Liangfu, Zhang Douguo, Wang Ruxue, Wen Xiaolei, Wang Pei, Ming Hai, Badugu Ramachandram, Lakowicz Joseph R
机构信息
Institute of Photonics, Department of Optics and Optical Engineering, University of Science and Technology of China, Hefei, Anhui, 230026, China.
Center for Micro- and Nanoscale Research and Fabrication, Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui, 230026, China.
出版信息
J Opt. 2017;19. doi: 10.1088/2040-8986/aa79cc. Epub 2017 Aug 9.
Leakage radiation microscopy (LRM) is used to investigate the optical properties of surfaces. The front-focal plane (FFP) image with LRM reveals structural features on the surfaces. Back-focal plane (BFP) image with LRM reveals the angular distribution of the radiation. Herein we experimentally demonstrate that the out-of-focal plane (OFP) images present a link between the FFP and BFP images and provide optical information that cannot be resolved by either FFP or BFP images. The OFP image provides a linkage between the spatial location of the emission and the angular distribution from the same location, and thus information about the film's discontinuity, nonuniformity or variable thickness can be uncovered. The use of OFP imaging will extend the scope and applications of the LRM and coupled emission imaging which are powerful tools in nanophotonics and high throughput fluorescence screening.
泄漏辐射显微镜（LRM）用于研究表面的光学特性。LRM的前焦平面（FFP）图像揭示了表面的结构特征。LRM的后焦平面（BFP）图像揭示了辐射的角分布。在此，我们通过实验证明，离焦平面（OFP）图像呈现了FFP和BFP图像之间的联系，并提供了FFP或BFP图像无法解析的光学信息。OFP图像提供了发射的空间位置与来自同一位置的角分布之间的联系，因此可以揭示有关薄膜的不连续性、不均匀性或可变厚度的信息。OFP成像的应用将扩展LRM和耦合发射成像的范围和应用，而这两种技术是纳米光子学和高通量荧光筛选中的强大工具。
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