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基于“注入”金属电极的片上电容耦合非接触式电导检测

On-chip capacitively coupled contactless conductivity detection using "injected" metal electrodes.

机构信息

Flinders Centre for Nanoscale Science and Technology, Flinders University, GPO Box 2100, Adelaide 5001, Australia.

出版信息

Analyst. 2013 Aug 7;138(15):4275-9. doi: 10.1039/c3an00870c. Epub 2013 Jun 10.

DOI:10.1039/c3an00870c
PMID:23749030
Abstract

We demonstrate the use of injected gallium electrodes for capacitively coupled contactless conductivity detection (C(4)D) within a microchip electrophoresis device. Evaluation of the electrodes for quantitative detection of electrophoretically separated lithium, sodium and potassium ions showed the system offers competitive detection limits of 6.1 × 10(-6) M, 6.7 × 10(-6) M and 8.5 × 10(-6) M, respectively. The fabrication process is fast, highly reproducible, and eliminates difficulties with electrode alignment. Using this approach C(4)D can be readily achieved in any microchip by simply adding extra 'electrode' channels to the microchip design.

摘要

我们展示了在微芯片电泳设备中使用注入镓电极进行电容耦合非接触式电导检测(C(4)D)的方法。对电极进行定量检测电泳分离的锂离子、钠离子和钾离子的评估表明,该系统分别提供了具有竞争力的检测限 6.1×10(-6) M、6.7×10(-6) M 和 8.5×10(-6) M。该制造工艺快速、高度重现,并且消除了电极对准的困难。通过这种方法,只需在微芯片设计中添加额外的“电极”通道,就可以在任何微芯片中轻松实现 C(4)D。

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