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利用各种原子力显微镜技术对深埋于聚合物基质中的金纳米颗粒进行成像。

Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques.

机构信息

Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510, Japan.

出版信息

Ultramicroscopy. 2013 Oct;133:41-9. doi: 10.1016/j.ultramic.2013.04.003. Epub 2013 Apr 23.

DOI:10.1016/j.ultramic.2013.04.003
PMID:23770541
Abstract

Recently, some papers reported successful imaging of subsurface features using atomic force microscopy (AFM). Some theoretical studies have also been presented, however the imaging mechanisms are not fully understood yet. In the preceeding papers, imaging of deeply buried nanometer-scale features has been successful only if they were buried in a soft matrix. In this paper, subsurface features (Au nanoparticles) buried in a soft polymer matrix were visualized. To elucidate the imaging mechanisms, various AFM techniques; heterodyne force microscopy, ultrasonic atomic force microscopy (UAFM), 2nd-harmonic UAFM and force modulation microscopy (FMM) were employed. The particles buried under 960 nm from the surface were successfully visualized which has never been achieved. The results elucidated that it is important for subsurface imaging to choose a cantilever with a suitable stiffness range for a matrix. In case of using the most suitable cantilever, the nanoparticles were visualized using every technique shown above except for FMM. The experimental results suggest that the subsurface features buried in a soft matrix with a depth of at least 1 µm can affect the local viscoelasticity (mainly viscosity) detected as the variation of the amplitude and phase of the tip oscillation on the surface. This phenomenon presumably makes it possible to visualize such deeply buried nanometer-scale features in a soft matrix.

摘要

最近,一些论文报道了使用原子力显微镜(AFM)成功地对亚表面特征进行成像。也提出了一些理论研究,然而,成像机制尚未完全理解。在之前的论文中,只有当纳米级特征被埋在软基质中时,才能成功地对深埋的纳米级特征进行成像。在本文中,成功地对埋在软聚合物基质中的亚表面特征(金纳米颗粒)进行了可视化。为了阐明成像机制,采用了各种 AFM 技术;外差力显微镜、超声原子力显微镜(UAFM)、二次谐波 UAFM 和力调制显微镜(FMM)。成功地可视化了埋在表面以下 960nm 处的颗粒,这是以前从未实现过的。结果表明,对于亚表面成像,选择适合基质的合适刚度范围的悬臂梁很重要。在使用最合适的悬臂梁的情况下,除了 FMM 之外,上述所有技术都可以可视化纳米颗粒。实验结果表明,埋在软基质中的亚表面特征,其深度至少为 1µm,可以影响表面上针尖振动的幅度和相位变化所检测到的局部粘弹性(主要是粘性)。这种现象可能使得在软基质中可视化这种深埋的纳米级特征成为可能。

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