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铟锡氧化物(ITO)纳米材料的宽带太赫兹电导率和光学透射率

Broadband terahertz conductivity and optical transmission of indium-tin-oxide (ITO) nanomaterials.

作者信息

Yang Chan-Shan, Chang Chan-Ming, Chen Po-Han, Yu Peichen, Pan Ci-Ling

机构信息

Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan.

出版信息

Opt Express. 2013 Jul 15;21(14):16670-82. doi: 10.1364/OE.21.016670.

Abstract

Indium-tin-oxide (ITO) nanorods (NRs) and nanowhiskers (NWhs) were fabricated by an electron-beam glancing-angle deposition (GLAD) system. These nanomaterials are of interests as transparent conducting electrodes in various devices. Two terahertz (THz) time-domain spectrometers (TDS) with combined spectral coverage from 0.15 to 9.00 THz were used. These allow accurate determination of the optical and electrical properties of such ITO nanomaterials in the frequency range from 0.20 to 4.00 THz. Together with Fourier transform infrared spectroscopic (FTIR) measurements, we found that the THz and far-infrared transmittance of these nanomaterials can be as high as 70% up to 15 THz, as opposed to about 9% for sputtered ITO thin films. The complex conductivities of ITO NRs, NWhs as well films are well fitted by the Drude-Smith model. Taking into account that the volume filling factors of both type of nanomaterials are nearly same, mobilities, and DC conductivities of ITO NWhs are higher than those of NRs due to less severe carrier localization effects in the former. On the other hand, mobilities of sputtered ITO thin films are poorer than ITO nanomaterials because of larger concentration of dopant ions in films, which causes stronger carrier scattering. We note further that consideration of the extreme values of Re{σ} and Im{σ} as well the inflection points, which are functions of the carrier scattering time (τ) and the expectation value of cosine of the scattering angle (γ), provide additional criteria for accessing the accuracy of the extraction of electrical parameters of non-Drude-like materials using THz-TDS. Our studies so far indicate ITO NWhs with heights of ~1000 nm show outstanding transmittance and good electrical characteristics for applications such as transparent conducting electrodes of THz Devices.

摘要

通过电子束掠角沉积(GLAD)系统制备了铟锡氧化物(ITO)纳米棒(NRs)和纳米晶须(NWhs)。这些纳米材料作为各种器件中的透明导电电极备受关注。使用了两台太赫兹(THz)时域光谱仪(TDS),其组合光谱覆盖范围为0.15至9.00 THz。这使得能够在0.20至4.00 THz的频率范围内准确测定此类ITO纳米材料的光学和电学性质。结合傅里叶变换红外光谱(FTIR)测量,我们发现这些纳米材料在高达15 THz的频率下太赫兹和远红外透过率可高达70%,而溅射ITO薄膜的透过率约为9%。ITO NRs、NWhs以及薄膜的复电导率都能很好地用德鲁德 - 史密斯模型拟合。考虑到这两种纳米材料的体积填充因子几乎相同,由于ITO NWhs中载流子的局域化效应较弱,其迁移率和直流电导率高于NRs。另一方面,溅射ITO薄膜的迁移率比ITO纳米材料差,因为薄膜中掺杂离子浓度较高,导致载流子散射更强。我们进一步指出,考虑实部{σ}和虚部{σ}的极值以及拐点,它们是载流子散射时间(τ)和散射角余弦期望值(γ)的函数,为评估使用太赫兹时域光谱(THz - TDS)提取非德鲁德型材料电学参数的准确性提供了额外标准。我们目前的研究表明,高度约为1000 nm的ITO NWhs在诸如太赫兹器件的透明导电电极等应用中表现出出色的透过率和良好的电学特性。

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