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位移测量干涉仪系统中具有亚纳米精度的相对光波前测量。

Relative optical wavefront measurement in displacement measuring interferometer systems with sub-nm precision.

作者信息

Meskers Arjan J H, Voigt Dirk, Spronck Jo W

机构信息

Delft University of Technology, department of Precision and Microsystems Engineering, Mekelweg 2, 2628CD Delft, The Netherlands.

出版信息

Opt Express. 2013 Jul 29;21(15):17920-30. doi: 10.1364/OE.21.017920.

DOI:10.1364/OE.21.017920
PMID:23938664
Abstract

Many error sources can affect the accuracy of displacement measuring interferometer systems. In heterodyne interferometry two laser source frequencies constitute the finally detected wavefront. When the wavefronts of these source frequencies are non-ideal and one of them walks off the detector, the shape of the detected wavefront will vary. This leads to a change in measured phase at the detector resulting in increased measurement uncertainty. A new wavefront measurement tool described in this publication measures the relative phase difference between the two wavefronts of the two source frequencies of a coaxial heterodyne laser source as used in commercial heterodyne interferometer systems. The proposed measurement method uses standard commercial optics and operates with the same phase measurement equipment that is normally used for heterodyne displacement interferometry. In the presented method a bare tip of a multimode fiber represents the receiving detection aperture and is used for locally sampling the wavefront during a line scan. The difference in phase between the beating frequency of the scanning fiber and a reference beating frequency that results from integration over the entire beam, is used for the reconstruction of the wavefront. The method shows to have a phase resolution in the order of ~25 pm or ~λ/25000 for λ 632.8 nm, and a spatial resolution of ~60 µm at a repeatability better than 1 nm over one week.

摘要

许多误差源会影响位移测量干涉仪系统的精度。在外差干涉测量中,两个激光源频率构成最终检测到的波前。当这些源频率的波前不理想且其中一个偏离探测器时,检测到的波前形状将会改变。这会导致探测器处测量相位发生变化,从而增加测量不确定性。本出版物中描述的一种新的波前测量工具,可测量商用外差干涉仪系统中同轴外差激光源的两个源频率的两个波前之间的相对相位差。所提出的测量方法使用标准商用光学器件,并与通常用于外差位移干涉测量的相同相位测量设备一起运行。在该方法中,多模光纤的裸尖端代表接收检测孔径,并用于在线扫描期间对波前进行局部采样。扫描光纤的拍频与整个光束积分产生的参考拍频之间的相位差,用于波前重建。该方法的相位分辨率约为25 pm,对于λ = 632.8 nm的光,约为λ/25000,空间分辨率约为60 µm,在一周内的重复性优于1 nm。

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引用本文的文献

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