基于空间光调制器的结构光照明显微镜的分辨率提高两倍。

Doubling the resolution of spatial-light-modulator-based differential interference contrast microscopy by structured illumination.

机构信息

Britton Chance Center for Biomedical Photonics, Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China.

出版信息

Opt Lett. 2013 Sep 1;38(17):3219-22. doi: 10.1364/OL.38.003219.

DOI:10.1364/OL.38.003219

PMID:23988918

Abstract

Recently developed spatial light modulator (SLM)-based differential interference contrast (DIC) microscopy [Opt. Lett. 34, 2988 (2009)] reveals flexibility on the implementation of DIC imaging. However, its numerical aperture (spatial resolution) is limited to maintain sufficient interference contrast, because it requires two beams to interfere. We present a structured illumination (SI) SLM-based DIC microscopy to effectively improve the lateral resolution of the SLM-based DIC microscopy. The SI field is generated and controlled by an adjustable grating displayed on an SLM. The SI SLM-based DIC expands the bandwidth of the coherent transfer function of the SLM-based DIC imaging system, thus improving the spatial resolution. The reconstructed SI SLM-based DIC image exhibits lateral resolution of approximately 208 nm, doubling that of the common SLM-based DIC image (approximately 415 nm). SI SLM-based DIC microscopy has the potential for achieving high-resolution quantitative phase images.

摘要

最近开发的基于空间光调制器 (SLM) 的微分干涉对比 (DIC) 显微镜 [Opt. Lett. 34, 2988 (2009)] 揭示了 DIC 成像实施的灵活性。然而，由于它需要两束光来干涉，因此其数值孔径（空间分辨率）受到限制以保持足够的干涉对比度。我们提出了一种基于结构照明 (SI) 的 SLM 微分干涉对比显微镜，以有效提高 SLM 微分干涉对比显微镜的横向分辨率。SI 场由 SLM 上显示的可调光栅生成和控制。基于 SI 的 SLM 微分干涉对比扩展了 SLM 微分干涉对比成像系统的相干传递函数带宽，从而提高了空间分辨率。重建的基于 SI 的 SLM 微分干涉对比图像显示出约 208nm 的横向分辨率，是普通基于 SLM 的微分干涉对比图像（约 415nm）的两倍。基于 SI 的 SLM 微分干涉对比显微镜具有实现高分辨率定量相位图像的潜力。