Institute for Research and Development on Advanced Radiation Technologies (radART), Paracelsus Medical University, Muellner Hauptstrasse 48, A-5020 Salzburg, Austria.
Phys Med Biol. 2013 Sep 21;58(18):6429-46. doi: 10.1088/0031-9155/58/18/6429. Epub 2013 Sep 2.
Amorphous silicon (aSi:H) flat panel detectors are prevalent in radiotherapy for megavoltage imaging tasks. Any clinical and dosimetrical application requires a well-defined dose response of the system to achieve meaningful results. Due to radiation damages, panels deteriorate and the linearity of pixel response to dose as well as the stability with regard to changing operating temperatures get worse with time. Using a single level gain correction can lead to an error of about 23% when irradiating a flood field image with 100 MU min(-1) on an old detector. A multi-level gain (MLG) correction is introduced, emending the nonlinearities and subpanel-related artifacts caused by insufficient radiation hardness of amplifiers in the read-out electronics. With rising temperature, offset values typically increase (up to 300 gray values) while the response at higher dose values per frame remain constant for a majority of pixels. To account for temperature-related image artifacts, two additional temperature correction methods have been developed. MLG in combination with temperature corrections can re-establish the aSi:H image quality to the performance required by reliable medical verification tools. Furthermore, the life span and recalibration intervals of these costly devices can be prolonged decisively.
非晶硅(a-Si:H)平板探测器在兆伏级成像任务的放射治疗中应用广泛。任何临床和剂量学应用都需要系统具有明确的剂量响应,以获得有意义的结果。由于辐射损伤,探测器会逐渐劣化,像素对剂量的线性响应以及对工作温度变化的稳定性会随着时间的推移而恶化。在对一个旧探测器进行 100MUmin(-1)的洪水场照射时,使用单一的增益校正水平会导致约 23%的误差。引入了多级增益(MLG)校正,以纠正由于读出电子学中的放大器辐射硬度不足而导致的非线性和子面板相关伪影。随着温度的升高,偏移值通常会增加(高达 300 灰度值),而对于大多数像素,每帧更高剂量值的响应保持不变。为了补偿与温度相关的图像伪影,还开发了两种额外的温度校正方法。MLG 与温度校正相结合,可以重新建立 a-Si:H 图像质量,使其达到可靠的医学验证工具所需的性能。此外,还可以显著延长这些昂贵设备的使用寿命和重新校准间隔。