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高性能纳米线氧化物薄膜晶体管。

High-performance nanowire oxide photo-thin film transistor.

机构信息

Samsung Advanced Institute of Technology, Samsung Electronics Co, Yongin-Si, Gyeonggi-Do, 446-712, Republic of Korea.

出版信息

Adv Mater. 2013 Oct 18;25(39):5549-54. doi: 10.1002/adma201301102. Epub 2013 Aug 27.

DOI:10.1002/adma201301102
PMID:24038596
Abstract

A gate-modulated nanowire oxide photosensor is fabricated by electron-beam lithography and conventional dry etch processing.. The device characteristics are good, including endurance of up to 10(6) test cycles, and gate-pulse excitation is used to remove persistent photoconductivity. The viability of nanowire oxide phototransistors for high speed and high resolution applications is demonstrated, thus potentially expanding the scope of exploitation of touch-free interactive displays.

摘要

通过电子束光刻和传统的干法刻蚀工艺,制作了栅极调制的纳米线氧化物光电传感器。器件性能良好,包括高达 10^6 次测试循环的耐久性,并且使用栅极脉冲激励来消除持久光电导。纳米线氧化物光电晶体管在高速和高分辨率应用中的可行性得到了证明,从而有可能扩大免触摸交互式显示器的应用范围。

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1
High-performance nanowire oxide photo-thin film transistor.高性能纳米线氧化物薄膜晶体管。
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引用本文的文献

1
Highly Responsive Blue Light Sensor with Amorphous Indium-Zinc-Oxide Thin-Film Transistor based Architecture.基于非晶铟锌氧化物薄膜晶体管架构的高响应蓝光传感器。
Sci Rep. 2018 May 25;8(1):8153. doi: 10.1038/s41598-018-26580-5.
2
Fast and slow transient charging of Oxide Semiconductor Transistors.氧化物半导体晶体管的快速和慢速瞬态充电
Sci Rep. 2017 Sep 19;7(1):11850. doi: 10.1038/s41598-017-12155-3.
3
Microsecond Pulse I-V Approach to Understanding Defects in High Mobility Bi-layer Oxide Semiconductor Transistor.微秒脉冲 I-V 法研究高迁移率双层氧化物半导体晶体管中的缺陷。
Sci Rep. 2017 Aug 15;7(1):8235. doi: 10.1038/s41598-017-06613-1.
4
Nanocrystalline ZnON; high mobility and low band gap semiconductor material for high performance switch transistor and image sensor application.纳米晶ZnON;用于高性能开关晶体管和图像传感器应用的高迁移率和低带隙半导体材料。
Sci Rep. 2014 May 13;4:4948. doi: 10.1038/srep04948.