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利用掠入射X射线衍射(GIXD)、反射高能电子衍射(RHEED)和掠入射小角X射线散射(GISAXS)对萤石上外延钴纳米颗粒进行三维倒易空间映射的内部观察。

A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS.

作者信息

Suturin S M, Fedorov V V, Korovin A M, Valkovskiy G A, Konnikov S G, Tabuchi M, Sokolov N S

机构信息

Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St Petersburg, Russian Federation.

出版信息

J Appl Crystallogr. 2013 Aug 1;46(Pt 4):874-881. doi: 10.1107/S0021889813008777. Epub 2013 Jun 7.

Abstract

In this work epitaxial growth of cobalt on CaF(111), (110) and (001) surfaces has been extensively studied. It has been shown by atomic force microscopy that at selected growth conditions stand-alone faceted Co nanoparticles are formed on a fluorite surface. Grazing-incidence X-ray diffraction (GIXD) and reflection high-energy electron diffraction (RHEED) studies have revealed that the particles crystallize in the face-centered cubic lattice structure otherwise non-achievable in bulk cobalt under normal conditions. The particles were found to inherit lattice orientation from the underlying CaF layer. Three-dimensional reciprocal space mapping carried out using X-ray and electron diffraction has revealed that there exist long bright 〈111〉 streaks passing through the cobalt Bragg reflections. These streaks are attributed to stacking faults formed in the crystal lattice of larger islands upon coalescence of independently nucleated smaller islands. Distinguished from the stacking fault streaks, crystal truncation rods perpendicular to the {111} and {001} particle facets have been observed. Finally, grazing-incidence small-angle X-ray scattering (GISAXS) has been applied to decouple the shape-related scattering from that induced by the crystal lattice defects. Particle faceting has been verified by modeling the GISAXS patterns. The work demonstrates the importance of three-dimensional reciprocal space mapping in the study of epitaxial nanoparticles.

摘要

在这项工作中,已对钴在CaF(111)、(110)和(001)表面的外延生长进行了广泛研究。原子力显微镜显示,在选定的生长条件下,萤石表面会形成独立的多面钴纳米颗粒。掠入射X射线衍射(GIXD)和反射高能电子衍射(RHEED)研究表明,这些颗粒结晶为面心立方晶格结构,而在正常条件下块状钴中无法实现这种结构。发现这些颗粒继承了下层CaF层的晶格取向。利用X射线和电子衍射进行的三维倒易空间映射表明,存在穿过钴布拉格反射的长亮〈111〉条纹。这些条纹归因于独立成核的较小岛合并时在较大岛的晶格中形成的堆垛层错。与堆垛层错条纹不同,已观察到垂直于{111}和{001}颗粒晶面的晶体截断棒。最后,掠入射小角X射线散射(GISAXS)已被用于将与形状相关的散射与晶格缺陷引起的散射解耦。通过对GISAXS图案进行建模验证了颗粒的刻面。这项工作证明了三维倒易空间映射在外延纳米颗粒研究中的重要性。

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