Syha Melanie, Trenkle Andreas, Lödermann Barbara, Graff Andreas, Ludwig Wolfgang, Weygand Daniel, Gumbsch Peter
Institute of Applied Materials, Karlsruhe Institute of Technology, Kaiserstrasse 12, 76128 Karlsruhe, Germany.
J Appl Crystallogr. 2013 Aug 1;46(Pt 4):1145-1150. doi: 10.1107/S002188981301580X. Epub 2013 Jul 18.
Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.
通过电子背散射衍射(EBSD)表征对多晶块状钛酸锶衍射对比断层扫描数据得到的微观结构重建进行了重新研究。将两种表征方法对应的二维晶粒图进行对齐和比较,重点关注内部界面处的空间分辨率。比较的晶界网络在形态和晶体取向上都显示出非常好的一致性。在衍射数据重建和EBSD数据收集技术的背景下,对偏差进行了严格评估和讨论。