Department of Plant Pathology, Montana State University, 59717, Bozeman, MT, USA.
Theor Appl Genet. 1990 May;79(3):422-6. doi: 10.1007/BF01186089.
Differences in levels of resistance toSeptoria tritici blotch were observed in plants with a specific height-reducing gene. When the gene 'Rht 2' was present either as an isoline or in the progeny, a higher degree of resistance was found. The most susceptible plants were observed in populations carrying the 'Rht 1' gene. Associations, as determined by phenotypic correlations, were detected betweenSeptoria tritici blotch and tall stature, late heading, and maturity. Plants having short stature, early heading, early maturity, and acceptable levels of resistance were identified in the F2 population whenRht 2 was present. Results of this study indicated that wheat breeders must select the appropriate dwarfing source that may confer resistance and grow large F2 populations, in order to increase the probability of obtaining desired genotypes.
在具有特定矮化基因的植株中观察到对叶锈病条斑的抗性水平存在差异。当基因 'Rht 2' 作为同系物或在后代中存在时,发现了更高程度的抗性。在携带 'Rht 1' 基因的群体中观察到最易感的植物。通过表型相关性确定了叶锈病条斑与高大植株、晚熟和成熟之间的关联。当存在 Rht 2 时,在 F2 群体中鉴定出具有短茎、早抽穗、早成熟和可接受抗性水平的植株。本研究结果表明,小麦育种者必须选择适当的矮化源,以赋予抗性并培育大型 F2 群体,以增加获得所需基因型的概率。