用于元素分析的缪子 X 射线的应用。

Application of muonic X-rays for elemental analysis.

机构信息

Physics Department, Technical University of Munich, Munich, FRG.

出版信息

Biol Trace Elem Res. 1987 Aug;13(1):301-18. doi: 10.1007/BF02796642.

Abstract

Because of the large μ mass compared to the electron mass, the muonic X-rays have energies very suitable for standard γ-ray spectroscopy (Ge detectors), so every element is easily recognized. By selecting the primary μ energies appropriately any part of the specimen, also well inside, can be nondestructively investigated. On the other hand, surface layers may be analyzed. Accuracies of quantitative analyses are 1% of the atomic abundance of the element in question in favorite cases. Results on applications in nuclear medicine and surface physics are presented, and ways of improving the muon flux density are discussed.

摘要

由于 μ 子质量与电子质量相比非常大，因此 μ 子 X 射线的能量非常适合标准 γ 射线光谱学（Ge 探测器），因此每个元素都很容易被识别。通过适当选择初始 μ 子能量，可以无损地研究样品的任何部分，甚至是内部深处。另一方面，表面层也可以进行分析。在理想情况下，对元素的定量分析的精度可以达到该元素原子丰度的 1%。本文介绍了在核医学和表面物理中的应用结果，并讨论了提高 μ 子通量密度的方法。