Department of Electrical and Computer Engineering, University of Wisconsin-Madison , 1415 Engineering Drive, Madison, Wisconsin 53706, United States.
Nano Lett. 2013;13(12):5979-84. doi: 10.1021/nl403163x. Epub 2013 Dec 2.
Dense arrays of indium arsenide (InAs) nanowire materials have been grown by selective-area metal-organic vapor-phase epitaxy (SA-MOVPE) using polystyrene-b-poly(methyl methacrylate) (PS/PMMA) diblock copolymer (DBC) nanopatterning technique, which is a catalyst-free approach. Nanoscale openings were defined in a thin (~10 nm) SiNx layer deposited on a (111)B-oriented GaAs substrate using the DBC process and CF4 reactive ion etching (RIE), which served as a hard mask for the nanowire growth. InAs nanowires with diameters down to ~ 20 nm and micrometer-scale lengths were achieved with a density of ~ 5 × 10(10) cm(2). The nanowire structures were characterized by scanning electron microscopy and transmission electron microscopy, which indicate twin defects in a primary zincblende crystal structure and the absence of threading dislocation within the imaged regions.
使用聚苯乙烯-聚甲基丙烯酸甲酯(PS/PMMA)嵌段共聚物(DBC)纳米图案化技术,通过选择性区域金属有机气相外延(SA-MOVPE)生长了密集排列的砷化铟(InAs)纳米线材料,这是一种无催化剂的方法。在(111)B 取向的 GaAs 衬底上沉积的约 10nm 厚的 SiNx 层中使用 DBC 工艺和 CF4 反应离子刻蚀(RIE)定义了纳米级开口,该开口用作纳米线生长的硬掩模。实现了直径约为 20nm 且长度达微米级的 InAs 纳米线,密度约为 5×10(10)cm(2)。通过扫描电子显微镜和透射电子显微镜对纳米线结构进行了表征,结果表明在初级闪锌矿晶体结构中存在孪晶缺陷,且在成像区域内不存在位错。