Institute of NanoEngineering and MicroSystems, Hsinchu 30013, Taiwan.
Nanoscale Res Lett. 2013 Dec 7;8(1):519. doi: 10.1186/1556-276X-8-519.
A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37. + q.
一个单独的 210nm 聚四氟乙烯（Teflon）纳米颗粒（sTNP）附着在氮化硅（Si3N4）原子力显微镜探针的顶点上，并通过接触带电进行充电。然后，带电荷的 sTNP 可以被视为一个点电荷，并用于使用 30nm 金/20nm 钛作为电极测量平行板电容器附近的静电场。该技术可以沿 X 和 Z 轴提供 250/100nm 的测量分辨率，并且可以测量到 50pN 以内的最小静电力。
