Nanotechnology. 2014 Jan 24;25(3):035705. doi: 10.1088/0957-4484/25/3/035705.
ZnO/MgO (core/shell) nanowires (NWs) grown by a two-step vapour transport method under different MgO shell growth conditions are examined by x-ray diffraction, photoluminescence (PL) excitation and temperature (10-300 K) dependent PL. The excitonic-to-defect PL ratio is increased by more than two orders of magnitude in the core/shell as compared to bare ZnO NWs. Concomitantly, a strong depression of the PL thermal quenching, most particularly for the visible part of the PL spectrum, occurs. Using a semi-quantitative model, results are interpreted as a strong radiative to non-radiative lifetime ratio reduction due to defect passivation at the ZnO NW walls and photocarrier confinement within the ZnO core by the MgO shell. These beneficial effects are, however, significantly weakened when metal interdiffusion across the core/shell interface is favoured during the shell growth. Non-radiative recombination lifetime in the sample with sharp core/shell interface is described by a single activation energy of 15 meV (bound exciton release). For interdiffused cases and bare ZnO an additional activation energy of 60 meV (free exciton breakup) is observed.
采用两步气相输运法在不同的 MgO 壳层生长条件下生长的 ZnO/MgO(核/壳)纳米线(NWs)通过 X 射线衍射、光致发光(PL)激发和温度(10-300 K)依赖的 PL 进行了研究。与裸 ZnO NWs 相比,核/壳中的激子-缺陷 PL 比增加了两个数量级以上。同时,PL 热猝灭明显减弱,特别是在 PL 光谱的可见部分。使用半定量模型,结果解释为由于 ZnO NW 壁上的缺陷钝化和 MgO 壳对 ZnO 核内光生载流子的限制,导致辐射到非辐射寿命比的强烈降低。然而,当壳层生长过程中有利于金属在核/壳界面上的互扩散时,这些有益的效果会显著减弱。具有尖锐核/壳界面的样品中的非辐射复合寿命由单个激活能 15 meV(束缚激子释放)来描述。对于互扩散的情况和裸 ZnO,观察到另一个 60 meV 的激活能(自由激子断裂)。