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互补电阻开关过渡金属氧化物中导电通道形状的演变

Evolution of the shape of the conducting channel in complementary resistive switching transition metal oxides.

作者信息

Yoon Kyung Jean, Song Seul Ji, Seok Jun Yeong, Yoon Jung Ho, Park Tae Hyung, Kwon Dae Eun, Hwang Cheol Seong

机构信息

Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea.

出版信息

Nanoscale. 2014 Feb 21;6(4):2161-9. doi: 10.1039/c3nr05426h. Epub 2013 Dec 23.

Abstract

Ultimate control of the defect distribution and local conduction path in a bipolar resistive switching (BRS) Pt/TiO2/Pt sample, which was in a unipolar reset state, is provided by means of voltage pulsing and the resulting time-transient current analysis. The limited amount of oxygen vacancies in this system allowed reversibly switching-diode-like current-voltage curves, which was also confirmed in another Magnéli-phase-containing Pt/WO3/Pt sample. Such careful control of the defect distribution allowed the achievement of a complementary resistive switching (CRS) curve even from a single switching layer. The unlimited vacancy source in the Pt/TiO2/TiO2-x/Pt sample did not allow the switching-diode type and the CRS behavior. The data retention of the on-state in the BRS was critically dependent on the shape of the rejuvenated conduction channel. The required time to lead to the rejuvenation of the conducting channel was ∼70-100 ns when the threshold voltage for the BRS set of ∼-1 V was applied.

摘要

通过电压脉冲和由此产生的时间瞬态电流分析,实现了对处于单极复位状态的双极电阻开关(BRS)Pt/TiO2/Pt样品中缺陷分布和局部传导路径的最终控制。该系统中有限数量的氧空位允许实现可逆的类似开关二极管的电流-电压曲线,这在另一个含马格内利相的Pt/WO3/Pt样品中也得到了证实。对缺陷分布的这种精细控制甚至可以从单个开关层实现互补电阻开关(CRS)曲线。Pt/TiO2/TiO2-x/Pt样品中无限的空位源不允许出现开关二极管类型和CRS行为。BRS中导通状态的数据保持能力严重依赖于恢复活力的传导通道的形状。当施加约-1 V的BRS阈值电压时,使传导通道恢复活力所需的时间约为70-100 ns。

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