Kim Kyung Min, Park Tae Hyung, Hwang Cheol Seong
Hewlett-Packard Laboratories, Hewlett-Packard Company, Palo Alto, California 94304, USA.
Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, South Korea.
Sci Rep. 2015 Jan 19;5:7844. doi: 10.1038/srep07844.
The resetting behaviors of Pt/TiO2/Pt resistive switching (RS) cell in unipolar RS operations were studied in detail through an experiment and by modeling. The experiment showed that the apparently highly arbitrary resetting current-voltage (I-V) curves could be grouped into three types: normal, delayed, and abnormal behaviors. A dual conical conducting filament (CF) model was conceived, and their electrothermal behaviors were analytically described from the heat-balance and charge-transport equations. The almost spontaneous resetting behavior of the normal reset could be easily understood from the mutually constructive interference effect between the Joule heating and temperature-dependent resistance effect along the CF. The delayed reset could be explained by the time-dependent increase in the reset voltage during the rest process, which was most probably induced in the more conical-shaped CF. The abnormal reset could be understood from the temporal transfer of oxygen ions near the kink positions of the two different-diameter portions of the more cylindrical CFs, which temporally decreases the overall resistance immediately prior for the actual reset to occur. The accuracy of the dual conical CF model was further confirmed by adopting a more thorough electrothermal simulation package, COMSOL.
通过实验和建模,详细研究了Pt/TiO2/Pt电阻开关(RS)单元在单极RS操作中的复位行为。实验表明,明显高度任意的复位电流-电压(I-V)曲线可分为三种类型:正常、延迟和异常行为。提出了一种双锥形导电细丝(CF)模型,并从热平衡和电荷传输方程对其电热行为进行了分析描述。正常复位几乎自发的复位行为可以很容易地从沿CF的焦耳热和温度依赖性电阻效应之间的相互建设性干涉效应来理解。延迟复位可以通过复位过程中复位电压随时间的增加来解释,这很可能是在更锥形的CF中引起的。异常复位可以从更圆柱形CF的两个不同直径部分的扭结位置附近氧离子的时间转移来理解,这在实际复位发生之前会暂时降低整体电阻。通过采用更全面的电热模拟软件包COMSOL,进一步证实了双锥形CF模型的准确性。