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用于4π(e,X)-γ符合测量的4π正比计数器中X射线和俄歇电子能谱的观测。

Observation of X-ray and Auger electron spectra in a 4π proportional counter for 4π(e, X)-γ coincidence measurements.

作者信息

Yunoki Akira, Kawada Yasushi, Hino Yoshio

机构信息

National Metrology Institute of Japan, National Institute of Advanced Industrial Sciences and Technology, Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan.

National Metrology Institute of Japan, National Institute of Advanced Industrial Sciences and Technology, Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan.

出版信息

Appl Radiat Isot. 2014 May;87:179-82. doi: 10.1016/j.apradiso.2013.11.105. Epub 2013 Dec 10.

DOI:10.1016/j.apradiso.2013.11.105
PMID:24373820
Abstract

For the standardization of electron capture nuclides followed by γ-transitions, the 4π(e, X)-γ coincidence counting method is mainly adopted. To examine how the spectra of the (e, X) channel change with gas nature and pressure, pulse-height spectrum measurements of signals from a 4π pressurized proportional counter were carried out under various conditions for (54)Mn and (88)Y sources together with 4π(e, X)-γ coincidence counting. The spectra were measured for each half of the counter and for the combined 4π signal. The nature of counting gas (P-10 or methane) and its pressure was reflected in the X-ray peak intensity, and the Auger electron spectra were influenced significantly by the absorption in a thin VYNS film and the source conditions. In the measurements, we employed a pill-box type 4π counter in which the anodes were very thin gold-coated tungsten wires (30 μm ∅). In this system, spectra down to 0. 2 keV were clearly seen. The gas pressure can be raised up to 0.6 MPa. Counting electronics used for 4π(e, X)-γ coincidence measurements were conventional modules and a list mode two-parameter data acquisition system.

摘要

对于随后发生γ跃迁的电子俘获核素的标准化,主要采用4π(e,X)-γ符合计数法。为了研究(e,X)通道的能谱如何随气体性质和压力变化,在不同条件下对来自4π加压正比计数器的信号进行了脉冲高度能谱测量,测量对象为(54)Mn和(88)Y源,并同时进行4π(e,X)-γ符合计数。对计数器的每一半以及组合的4π信号都进行了能谱测量。计数气体(P-10或甲烷)的性质及其压力反映在X射线峰强度上,俄歇电子能谱受到薄VYNS膜中的吸收和源条件的显著影响。在测量中,我们使用了一种药盒式4π计数器,其阳极是非常细的镀金黄钨丝(直径30μm)。在这个系统中,可以清楚地看到低至0.2keV的能谱。气体压力可以提高到0.6MPa。用于4π(e,X)-γ符合测量的计数电子设备是传统模块和列表模式双参数数据采集系统。

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