Korte G E, Heriot W, Pollack A
Ophthalmic Res. 1986;18(6):321-6. doi: 10.1159/000265457.
The high-voltage electron microscope (HVEM) permits examination of sections much thicker (up to 1 micron) than those usually used in transmission electron microscopy, which are approximately 70 nm in thickness. Two examples of the utility of the HVEM in research on the ultrastructure of the retinal pigment epithelium (RPE) and choriocapillaris are given: the identification of intracytoplasmic tubules that arise from the basal plasma membrane of rat RPE cells; and the tracing of processes arising from choriocapillary endothelial cells during experimentally induced neovascularization. In each case HVEM provided information not easily obtained in routine thin sections.
高压电子显微镜（HVEM）可以检查比透射电子显微镜通常使用的切片厚得多（可达1微米）的切片，后者的厚度约为70纳米。文中给出了两个关于HVEM在视网膜色素上皮（RPE）和脉络膜毛细血管超微结构研究中的应用实例：鉴定源自大鼠RPE细胞基底质膜的胞质内小管；以及追踪实验诱导新生血管形成过程中脉络膜毛细血管内皮细胞产生的突起。在每种情况下，HVEM都提供了在常规薄切片中不易获得的信息。
