Centre for Organic Photonics & Electronics, The University of Queensland , St. Lucia, QLD 4072, Australia.
Langmuir. 2014 Feb 11;30(5):1410-5. doi: 10.1021/la403951j. Epub 2014 Jan 27.
Fullerene derivatives are commonly used as electron acceptors in combination with (macro)molecular electron donors in bulk heterojunction (BHJ) organic photovoltaic (OPV) devices. Understanding the BHJ structure at different electron donor/acceptor ratios is critical to the continued improvement and development of OPVs. The high neutron scattering length densities (SLDs) of the fullerenes provide effective contrast for probing the distribution of the fullerene within the blend in a nondestructive way. However, recent neutron scattering studies on BHJ films have reported a wide range of SLDs ((3.6-4.4) × 10(-6) Å(-2)) for the fullerenes 60-PCBM and 70-PCBM, leading to differing interpretations of their distribution in thin films. In this article, we describe an approach for determining more precisely the scattering length densities of the fullerenes within a polymer matrix in order to accurately quantify their distribution within the active layers of OPV devices by neutron scattering techniques.
富勒烯衍生物通常被用作体异质结(BHJ)有机光伏(OPV)器件中与(大)分子电子给体组合的电子受体。了解不同电子给体/受体比的 BHJ 结构对于 OPV 的持续改进和发展至关重要。富勒烯的高中子散射长度密度(SLD)为以非破坏性方式探测混合物中富勒烯的分布提供了有效的对比。然而,最近对 BHJ 薄膜的中子散射研究报告了 60-PCBM 和 70-PCBM 富勒烯的 SLD 范围很广((3.6-4.4)×10(-6)Å(-2)),导致对它们在薄膜中的分布有不同的解释。在本文中,我们描述了一种方法,用于更精确地确定聚合物基质中富勒烯的散射长度密度,以便通过中子散射技术准确地量化它们在 OPV 器件活性层中的分布。