纳米级Galinobisuitite薄膜的结构和光学性质。
Structural and optical properties of nanoscale Galinobisuitite thin films.
作者信息
Abd-Elkader Omar H, Deraz N M
机构信息
Department of Zoology, Science College, King Saud University, P.O. Box 2455, Riyadh 11451, Saudi Arabia.
Laboratory of Surface Chemistry and Catalysis, Physical Chemistry Department, National Research Center, Dokki, Cairo 12622, Egypt.
出版信息
Int J Mol Sci. 2014 Jan 27;15(2):1842-51. doi: 10.3390/ijms15021842.
Galinobisuitite thin films of (Bi2S3)(PbS) were prepared using the chemical bath deposition technique (CBD). Thin films were prepared by a modified chemical deposition process by allowing the triethanolamine (TEA) complex of Bi(3+) and Pb(2+) to react with S(2)- ions, which are released slowly by the dissociation of the thiourea (TU) solution. The films are polycrystalline and the average crystallite size is 35 nm. The composition of the films was measured using the atomic absorption spectroscopy (AAS) technique. The films are very adherent to the substrates. The crystal structure of Galinobisuitite thin films was calculated by using the X-ray diffraction (XRD) technique. The surface morphology and roughness of the films were studied using scanning electron microscopes (SEM), transmission electron microscopes (TEM) and stylus profilers respectively. The optical band gaps of the films were estimated from optical measurements.
采用化学浴沉积技术（CBD）制备了（Bi2S3）（PbS）的硫铋铅矿薄膜。通过改进的化学沉积工艺制备薄膜，使Bi(3+)和Pb(2+)的三乙醇胺（TEA）络合物与硫脲（TU）溶液解离缓慢释放的S(2)-离子反应。这些薄膜是多晶的，平均晶粒尺寸为35纳米。使用原子吸收光谱（AAS）技术测量薄膜的成分。薄膜与基底的附着力很强。利用X射线衍射（XRD）技术计算硫铋铅矿薄膜的晶体结构。分别使用扫描电子显微镜（SEM）、透射电子显微镜（TEM）和触针轮廓仪研究了薄膜的表面形貌和粗糙度。通过光学测量估算了薄膜的光学带隙。
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