Department of Physics, Gauhati University, Guwahati-781014, Assam, India.
Beilstein J Nanotechnol. 2012;3:438-43. doi: 10.3762/bjnano.3.50. Epub 2012 Jun 6.
Nanocrystalline lead selenide (PbSe) thin films were prepared on glass substrates by a chemical bath deposition method, using sodium selenosulfate (Na(2)SeSO(3)) as a source of Se(2-) ions, and lead acetate as a source of Pb(2+) ions. Trisodium citrate (TSC) was used as a complexing agent. PbSe films were prepared at various deposition temperatures while the pH value was kept fixed at 11, and the effect on the resulting film properties was studied by X-ray diffraction (XRD), X-ray fluorescence (XRF), scanning electron microscopy (SEM) and optical absorption studies. The structural parameters, such as the lattice constant (a), crystallite size (D), dislocation density (ρ) and microstrain (ε) were evaluated from the XRD spectra. It was found that average crystallite size, as calculated from Scherrer's formula, increased from 23 to 33 nm as the deposition temperature was varied from 303 to 343 K. The dislocation density and microstrain were found to vary inversely with the crystallite size, whereas the lattice constant was found to increase with an increase in crystallite size. The optical absorption spectra of the nanocrystalline PbSe films showed a blue shift, and the optical band gap (E(g)) was found to increase from 1.96 to 2.10 eV with the decrease in crystallite size.
采用化学浴沉积法在玻璃衬底上制备了纳米晶硒化铅(PbSe)薄膜,使用亚硒酸钠(Na2SeSO3)作为硒(Se2-)离子源,醋酸铅作为 Pb2+离子源。三钠柠檬酸(TSC)用作络合剂。在不同的沉积温度下制备了 PbSe 薄膜,同时保持 pH 值固定在 11,通过 X 射线衍射(XRD)、X 射线荧光(XRF)、扫描电子显微镜(SEM)和光吸收研究研究了其对所得薄膜性能的影响。从 XRD 谱中评估了结构参数,如晶格常数(a)、晶粒尺寸(D)、位错密度(ρ)和微观应变(ε)。发现,根据谢勒公式计算的平均晶粒尺寸从 303 K 到 343 K 变化时,从 23nm 增加到 33nm。位错密度和微观应变与晶粒尺寸成反比,而晶格常数随着晶粒尺寸的增加而增加。纳米晶 PbSe 薄膜的光吸收谱显示出蓝移,并且发现光学带隙(E(g))随着晶粒尺寸的减小从 1.96eV 增加到 2.10eV。