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通过全息干涉测量法测定光聚合物薄膜全息记录过程中的收缩率。

Shrinkage during holographic recording in photopolymer films determined by holographic interferometry.

作者信息

Moothanchery Mohesh, Bavigadda Viswanath, Toal Vincent, Naydenova Izabela

出版信息

Appl Opt. 2013 Dec 10;52(35):8519-27. doi: 10.1364/AO.52.008519.

DOI:10.1364/AO.52.008519
PMID:24513896
Abstract

Shrinkage of photopolymer materials is an important factor for their use in holographic data storage and for fabrication of holographic optical elements. Dimensional change in the holographic element leads to a requirement for compensation in the reading angle and/or wavelength. Normally, shrinkage is studied at the end of the polymerization process and no information about the dynamics is obtained. The aim of this study was to use holographic interferometry to measure the shrinkage that occurs during holographic recording of transmission diffraction gratings in acrylamide photopolymer layers. Shrinkage in photopolymer layers can be measured over the whole recorded area by real-time capture of holographic interferograms at regular intervals during holographic recording using a complimentary metal-oxide-semiconductor camera. The optical path length change, and hence the shrinkage, are determined from the captured fringe patterns. Through analysis of the real-time shrinkage curves, it is possible to distinguish two processes that determine the value of shrinkage in the photopolymer layer. These processes are ascribed to monomer polymerization and crosslinking of polymer chains. The dependence of shrinkage of the layers on the conditions of recording such as recording intensity, single or double beam exposure, and the physical properties of the layers, such as thickness, were studied. Higher shrinkage was observed with recordings at lower intensities and in thinner layers. Increased shrinkage was also observed in the case of single beam polymerization in comparison to the case of double beam holographic exposure.

摘要

光聚合物材料的收缩是其用于全息数据存储和全息光学元件制造的一个重要因素。全息元件中的尺寸变化导致需要对读取角度和/或波长进行补偿。通常,收缩是在聚合过程结束时进行研究的,无法获得有关动力学的信息。本研究的目的是使用全息干涉术来测量在丙烯酰胺光聚合物层中全息记录透射衍射光栅期间发生的收缩。通过使用互补金属氧化物半导体相机在全息记录期间定期实时捕获全息干涉图,可以在整个记录区域测量光聚合物层中的收缩。从捕获的条纹图案确定光程长度变化,进而确定收缩。通过分析实时收缩曲线,可以区分决定光聚合物层收缩值的两个过程。这些过程归因于单体聚合和聚合物链的交联。研究了层收缩对记录条件(如记录强度、单光束或双光束曝光)以及层的物理性质(如厚度)的依赖性。在较低强度记录和较薄层中观察到较高的收缩。与双光束全息曝光相比,单光束聚合情况下也观察到收缩增加。

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