Nanosystem Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan. Japan Science and Technology Agency, CREST, 7 Chiyoda, Tokyo 102-0076, Japan.
J Phys Condens Matter. 2014 Apr 2;26(13):135001. doi: 10.1088/0953-8984/26/13/135001. Epub 2014 Mar 6.
The electronic structure of electrostatically doped MoS2 thin films is investigated on the basis of first-principles total-energy calculations. We find that electron injection leads to a rapid downward shift in the energy of the unoccupied nearly free electron (NFE) state relative to other conduction bands. The NFE state finally crosses the Fermi level at an electron density of 0.81 × 10(14) cm(-2) that is attributable to the strong local electric field induced by charge accumulation near the surface. Electrons accommodated in the NFE state play an important role in determining the conducting properties of MoS2 thin films.
基于第一性原理的总能量计算,我们研究了静电掺杂 MoS2 薄膜的电子结构。我们发现,电子注入导致未占据的近自由电子(NFE)态的能量相对于其他导带迅速向下移动。NFE 态最终在电子密度为 0.81×10(14)cm(-2)时穿过费米能级,这归因于电荷积累在表面附近引起的强局域电场。容纳在 NFE 态中的电子在决定 MoS2 薄膜的导电性质方面起着重要作用。