Wu Jianhui, Yuan Yiran, Duan Hongxia, Qin Shaozheng, Buchanan Tony W, Zhang Kan, Zhang Liang
Key Laboratory of Behavioral Science, Institute of Psychology, Chinese Academy of Sciences, Beijing, China.
Key Laboratory of Behavioral Science, Institute of Psychology, Chinese Academy of Sciences, Beijing, China; University of Chinese Academy of Sciences, Beijing, China.
Biol Psychol. 2014 May;99:77-82. doi: 10.1016/j.biopsycho.2014.03.002. Epub 2014 Mar 18.
Exposure to long-term stress has a variety of consequences on the brain and cognition. Few studies have examined the influence of long-term stress on event related potential (ERP) indices of error processing. The current study investigated how long-term academic stress modulates the error related negativity (Ne or ERN) and the error positivity (Pe) components of error processing. Forty-one male participants undergoing preparation for a major academic examination and 20 non-exam participants completed a Go-NoGo task while ERP measures were collected. The exam group reported higher perceived stress levels and showed increased Pe amplitude compared with the non-exam group. Participants' rating of the importance of the exam was positively associated with the amplitude of Pe, but these effects were not found for the Ne/ERN. These results suggest that long-term academic stress leads to greater motivational assessment of and higher emotional response to errors.
长期暴露于压力之下会对大脑和认知产生多种影响。很少有研究探讨长期压力对错误加工的事件相关电位（ERP）指标的影响。本研究调查了长期学业压力如何调节错误加工的错误相关负波（Ne或ERN）和错误正波（Pe）成分。41名正在准备一场重要学术考试的男性参与者和20名非考试参与者在完成一个Go-NoGo任务的同时收集ERP测量数据。与非考试组相比，考试组报告的感知压力水平更高，且Pe波幅增加。参与者对考试重要性的评分与Pe波幅呈正相关，但在Ne/ERN方面未发现这些效应。这些结果表明，长期学业压力会导致对错误进行更大程度的动机评估和更高的情绪反应。
