Lee Sang Heon
Department of Mechanical Design Engineering, Andong National University, Andong 760-749, South Korea.
Rev Sci Instrum. 2014 Mar;85(3):033708. doi: 10.1063/1.4869474.
In this paper, we propose a probe-rotating atomic force microscope that enables scan in an arbitrary direction in the contact imaging mode, which is difficult to achieve using a conventional atomic force microscope owing to the orientation-dependent probe and the inability to rotate the probe head. To enable rotation of the probe about its vertical axis, we employed a compact and light probe head, the sensor of which is made of an optical disk drive pickup unit. Our proposed mechanical configuration, operating principle, and control system enables axial and lateral scan in various directions.
在本文中，我们提出了一种探针旋转原子力显微镜，它能够在接触成像模式下沿任意方向进行扫描，而传统原子力显微镜由于探针的方向依赖性以及无法旋转探头，难以实现这一点。为了使探针能够绕其垂直轴旋转，我们采用了一种紧凑且轻便的探头，其传感器由光盘驱动器拾取单元制成。我们提出的机械结构、工作原理和控制系统能够在各个方向上进行轴向和横向扫描。
