• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

注意:用于大行程精密测量系统的紧凑型轻量位移传感器。

Note: Compact and light displacement sensor for a precision measurement system in large motion.

作者信息

Lee Sang Heon

机构信息

Department of Mechanical Design Engineering, Andong National University, Andong, Kyungbuk 760-749, South Korea.

出版信息

Rev Sci Instrum. 2015 Aug;86(8):086103. doi: 10.1063/1.4928528.

DOI:10.1063/1.4928528
PMID:26329243
Abstract

We developed a compact and light displacement sensor applicable to systems that require wide range motions of its sensing device. The proposed sensor utilized the optical pickup unit of the optical disk drive, which has been used applied to atomic force microscopy (AFM) because of its compactness and lightness as well as its high performance. We modified the structure of optical pickup unit and made the compact sensor driver attachable to a probe head of AFM to make large rotation. The feasibilities of the developed sensor for a general probe-moving measurement device and for probe-rotating AFM were verified. Moreover, a simple and precise measurement of alignment between centers of rotator and probe tip in probe-rotation AFM was experimentally demonstrated using the developed sensor.

摘要

我们开发了一种紧凑轻便的位移传感器,适用于其传感装置需要大范围运动的系统。所提出的传感器利用了光盘驱动器的光学拾取单元,由于其紧凑性、轻便性以及高性能,该单元已被应用于原子力显微镜(AFM)。我们修改了光学拾取单元的结构,并使紧凑型传感器驱动器可连接到AFM的探头,以实现大角度旋转。验证了所开发的传感器用于一般探针移动测量装置和探针旋转AFM的可行性。此外,使用所开发的传感器通过实验证明了在探针旋转AFM中对旋转器中心与探针尖端之间对准的简单而精确的测量。

相似文献

1
Note: Compact and light displacement sensor for a precision measurement system in large motion.注意:用于大行程精密测量系统的紧凑型轻量位移传感器。
Rev Sci Instrum. 2015 Aug;86(8):086103. doi: 10.1063/1.4928528.
2
Probe-rotating atomic force microscopy for determining material properties.用于确定材料特性的探针旋转原子力显微镜。
Rev Sci Instrum. 2014 Mar;85(3):033708. doi: 10.1063/1.4869474.
3
High precision deflection measurement of microcantilever in an optical pickup head based atomic force microscopy.基于光学头的原子力显微镜中微悬臂梁的高精度挠度测量
Rev Sci Instrum. 2012 Nov;83(11):113703. doi: 10.1063/1.4768459.
4
Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications.用于纳米机器人应用的压电扫描探针的温和快速原子力显微镜。
Nanotechnology. 2013 Feb 15;24(6):065502. doi: 10.1088/0957-4484/24/6/065502. Epub 2013 Jan 22.
5
A compact CCD-monitored atomic force microscope with optical vision and improved performances.一种带有光学视觉和改进性能的紧凑型 CCD 监测原子力显微镜。
Microsc Res Tech. 2013 Sep;76(9):931-5. doi: 10.1002/jemt.22250. Epub 2013 Jun 26.
6
Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy.一种基于石英音叉的、由用于动态模式原子力显微镜的离散谐振器组成的探针的实现与表征。
Rev Sci Instrum. 2010 Jun;81(6):063706. doi: 10.1063/1.3455219.
7
Axial scanning laser Doppler velocimeter using wavelength change without moving mechanism in sensor probe.采用波长变化且传感器探头无移动机构的轴向扫描激光多普勒测速仪。
Opt Express. 2011 Mar 28;19(7):5960-9. doi: 10.1364/OE.19.005960.
8
Development of a precision indentation and scratching system with a tool force and displacement control module.开发一种带有工具力和位移控制模块的精密压痕与划痕系统。
Rev Sci Instrum. 2007 Apr;78(4):045102. doi: 10.1063/1.2719622.
9
Development of a microlateral force sensor and its evaluation using lateral force microscopy.一种微侧向力传感器的研制及其利用侧向力显微镜的评估。
Rev Sci Instrum. 2007 Mar;78(3):033701. doi: 10.1063/1.2714038.
10
Compact directional acoustic sensor using a multi-fiber optical probe.使用多光纤光学探头的紧凑型定向声传感器。
J Acoust Soc Am. 2013 Feb;133(2):832-41. doi: 10.1121/1.4773275.