Rosenberg M J, Séguin F H, Waugh C J, Rinderknecht H G, Orozco D, Frenje J A, Johnson M Gatu, Sio H, Zylstra A B, Sinenian N, Li C K, Petrasso R D, Glebov V Yu, Stoeckl C, Hohenberger M, Sangster T C, LePape S, Mackinnon A J, Bionta R M, Landen O L, Zacharias R A, Kim Y, Herrmann H W, Kilkenny J D
Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA.
Rev Sci Instrum. 2014 Apr;85(4):043302. doi: 10.1063/1.4870898.
CR-39 solid-state nuclear track detectors are widely used in physics and in many inertial confinement fusion (ICF) experiments, and under ideal conditions these detectors have 100% detection efficiency for ∼0.5-8 MeV protons. When the fluence of incident particles becomes too high, overlap of particle tracks leads to under-counting at typical processing conditions (5 h etch in 6N NaOH at 80 °C). Short etch times required to avoid overlap can cause under-counting as well, as tracks are not fully developed. Experiments have determined the minimum etch times for 100% detection of 1.7-4.3-MeV protons and established that for 2.4-MeV protons, relevant for detection of DD protons, the maximum fluence that can be detected using normal processing techniques is ≲3 × 10(6) cm(-2). A CR-39-based proton detector has been developed to mitigate issues related to high particle fluences on ICF facilities. Using a pinhole and scattering foil several mm in front of the CR-39, proton fluences at the CR-39 are reduced by more than a factor of ∼50, increasing the operating yield upper limit by a comparable amount.
CR-39固态核径迹探测器广泛应用于物理学以及许多惯性约束聚变(ICF)实验中。在理想条件下,这些探测器对能量约为0.5 - 8 MeV的质子具有100%的探测效率。当入射粒子的注量变得过高时,粒子径迹的重叠会导致在典型处理条件下(80°C在6N NaOH中蚀刻5小时)计数不足。为避免重叠所需的短蚀刻时间也会导致计数不足,因为径迹未完全形成。实验已经确定了对1.7 - 4.3 MeV质子进行100%探测所需的最短蚀刻时间,并确定对于与DD质子探测相关的2.4 MeV质子,使用常规处理技术能够探测到的最大注量约为≲3×10(6) cm(-2)。已经开发出一种基于CR-39的质子探测器,以缓解ICF设施中与高粒子注量相关的问题。通过在CR-39前面几毫米处使用针孔和散射箔,CR-39处的质子注量降低了约50倍以上,使运行产额上限提高了相当的幅度。