一种利用光学频率梳干涉仪测定等离子体电子密度的新方法。

A new method for determining the plasma electron density using optical frequency comb interferometer.

作者信息

Arakawa Hiroyuki, Tojo Hiroshi, Sasao Hajime, Kawano Yasunori, Itami Kiyoshi

机构信息

Japan Atomic Energy Agency, 801-1 Mukoyama, Naka-shi, Ibaraki 311-0193, Japan.

出版信息

Rev Sci Instrum. 2014 Apr;85(4):043508. doi: 10.1063/1.4870925.

DOI:10.1063/1.4870925

PMID:24784608

Abstract

A new method of plasma electron density measurement using interferometric phases (fractional fringes) of an optical frequency comb interferometer is proposed. Using the characteristics of the optical frequency comb laser, high density measurement can be achieved without fringe counting errors. Simulations show that the short wavelength and wide wavelength range of the laser source and low noise in interferometric phases measurements are effective to reduce ambiguity of measured density.

摘要

提出了一种利用光学频率梳干涉仪的干涉相位（分数条纹）测量等离子体电子密度的新方法。利用光学频率梳激光器的特性，可以实现高密度测量而不会出现条纹计数误差。模拟表明，激光源的短波长和宽波长范围以及干涉相位测量中的低噪声有效地降低了测量密度的模糊度。