Zhou Hailong, Yan Siqi, Dong Jianji, Zhang Xinliang
Opt Lett. 2014 Jun 1;39(11):3173-6. doi: 10.1364/OL.39.003173.
We put forward a double-slit interference device based on two metal subwavelength slit arrays to measure the orbital angular momentum (OAM) and the polarization of beams simultaneously. The subwavelength slit serves as a localized spatial polarizer, and each slit array can be regarded as a wide diffraction-slit. When an OAM beam is normally incident upon the two slit arrays, the interference fringes twist, and the displacement depends on the topological charge of OAM beams. We present a detailed theoretical analysis of this measurement model. This model does not need additional reference light and is a linear model.
我们提出了一种基于两个金属亚波长狭缝阵列的双缝干涉装置,用于同时测量光束的轨道角动量(OAM)和偏振态。亚波长狭缝用作局部空间偏振器,每个狭缝阵列可视为一个宽衍射狭缝。当一个OAM光束垂直入射到两个狭缝阵列上时,干涉条纹会发生扭曲,其位移取决于OAM光束的拓扑电荷数。我们对该测量模型进行了详细的理论分析。该模型不需要额外的参考光,是一个线性模型。