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通过心脏植入式电子设备问询确定的年度房性快速性心律失常负荷与缺血性卒中风险相关,且独立于已知风险因素。

Annual atrial tachyarrhythmia burden determined by device interrogation in patients with cardiac implanted electronic devices is associated with a risk of ischaemic stroke independent of known risk factors.

作者信息

Wang Szu-Heng, Kang Yu-Chuan, Wang Chun-Chieh, Wen Ming-Shien, Hung Kuo-Chun, Wang Chao-Yung, Chen Tien-Hsing

机构信息

Chang Gung University College of Medicine, Taoyuan, Taiwan.

Division of Cardiology, Chang-Gung Memorial Hospital, Linkou, Taiwan.

出版信息

Eur J Cardiothorac Surg. 2015 May;47(5):840-6. doi: 10.1093/ejcts/ezu252. Epub 2014 Jun 26.

DOI:10.1093/ejcts/ezu252
PMID:24970573
Abstract

OBJECTIVES

This study evaluated the risk of non-fatal ischaemic stroke associated with increased long-term cumulative duration of atrial tachycardia (AT).

METHODS

We retrospectively reviewed the records of 260 patients with cardiovascular implantable electronic devices capable of monitoring AT. Patients were separated into zero, low and high AT burden groups. The cut-off point between low and high AT burden was defined by the median value of AT burden in the non-zero AT burden groups (5% in 1 year, about 18 days annually). The primary outcome was non-fatal ischaemic stroke.

RESULTS

The mean patient age was 63.3 ± 13.7 years, the average follow-up was 7.0 years and 10 patients had strokes. Multivariate analysis showed only hypertension and a diagnosis of atrial fibrillation (AF) were associated with stroke. The risk of stroke in patients with hypertension was 12.57-fold higher than in those without hypertension, and was 20.81-fold higher in patients with paroxysmal AF and 162.59-fold higher in patients with chronic AF than in those without AF. Kaplan-Meier analysis showed that stroke-free survival was significantly different in the three AT burden groups (P = 0.002, long-rank test); the rate was greatest in the zero AT burden group, followed by the low AT burden group and was lowest in the high AT burden group.

CONCLUSIONS

Patients who accumulated an AT duration exceeding 5% (18 days) of the total time in any of the 1-year periods are more likely to have an ischaemic stroke than those who have a low or zero AT burden.

摘要

目的

本研究评估了与房性心动过速(AT)长期累积持续时间增加相关的非致命性缺血性卒中风险。

方法

我们回顾性分析了260例可监测AT的心血管植入式电子设备患者的记录。患者被分为零、低和高AT负荷组。低AT负荷和高AT负荷之间的分界点由非零AT负荷组中AT负荷的中位数定义(1年中为5%,每年约18天)。主要结局为非致命性缺血性卒中。

结果

患者平均年龄为63.3±13.7岁,平均随访7.0年,10例患者发生卒中。多因素分析显示,仅高血压和房颤(AF)诊断与卒中相关。高血压患者发生卒中的风险比无高血压患者高12.57倍,阵发性AF患者高20.81倍,慢性AF患者高162.59倍。Kaplan-Meier分析显示,三个AT负荷组的无卒中生存率有显著差异(P = 0.002,对数秩检验);零AT负荷组的发生率最高,其次是低AT负荷组,高AT负荷组最低。

结论

在任何1年期间,AT持续时间累计超过总时间5%(18天)的患者比AT负荷低或为零的患者更易发生缺血性卒中。

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