Shen E-Chin, Fu Earl, Fu Martin Ming-Jen, Peng Michelle
Int J Oral Maxillofac Implants. 2014 Jul-Aug;29(4):893-7. doi: 10.11607/jomi.3435.
The configuration and degree of corticalization of bifid mandibular canals were examined using medical computed tomography (CT) images from 170 hemimandibles obtained from 308 Taiwanese adults.
The configurations of the bifid canals were assessed according to their anatomical position in relation to the ramus, molars, premolars, and mental foramen; their course (anterior/posterior or superior/inferior); the presence or absence of confluence with the main mandibular canal; and the presence or absence of penetration through the mandible to form an accessory foramen. The percentage of the canal length that was corticalized was measured. Two different classifications of bifid canals were also briefly summarized and compared.
When bifid canals are present (41.2% of patients; 27.6% of hemimandibles), the bifid canals were primarily located in the ramus and retromolar regions (67.7%) running anteriorly (95.9%) and superiorly (95.9%) without confluence with the main mandibular canal (91.1%). Up to 16.5% of bifid canals form accessory foramina on the cortical surface of the mandible. Approximately 78% of the bifid canals have varied degrees of corticalization around the bifid canals.
The configuration and course of 170 mandibular bifid canals were evaluated with CT images. The bifid canals were primarily located in the ramus and retromolar regions; however, 32.4% of the bifid canals were located in potential positions for dental implant placement. Most of the bifid canals ran anteriorly superior to the main mandibular canal, did not rejoin with the main mandibular canal, and diminished within the mandibular body. Approximately half of the bifid canals (45%) were completely corticated.
利用从308名台湾成年人获取的170个半侧下颌骨的医学计算机断层扫描(CT)图像,检查下颌骨双管的形态结构及皮质化程度。
根据双管在下颌支、磨牙、前磨牙及颏孔的解剖位置、走行方向(前后或上下)、与下颌主根管是否汇合以及是否穿透下颌骨形成副孔,对双管的形态结构进行评估。测量双管皮质化的管长百分比。还简要总结并比较了双管的两种不同分类。
存在双管时(41.2%的患者;27.6%的半侧下颌骨),双管主要位于下颌支和磨牙后区(67.7%),向前走行(95.9%)且向上走行(95.9%),不与下颌主根管汇合(91.1%)。高达16.5%的双管在下颌骨皮质表面形成副孔。约78%的双管在双管周围有不同程度的皮质化。
用CT图像评估了170个下颌双管的形态结构和走行方向。双管主要位于下颌支和磨牙后区;然而,32.4%的双管位于种植牙植入的潜在位置。大多数双管走行于下颌主根管前方且位置较高,不与下颌主根管重新汇合,并在下颌体内变细。约一半的双管(45%)完全被皮质骨包绕。