环境条件下的原子力显微镜辅助扫描隧道谱学

Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions.

作者信息

Vakhshouri Amin, Hashimoto Katsushi, Hirayama Yoshiro

机构信息

Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan

Department of Physics, Graduate School of Science, Tohoku University, Sendai, Miyagi 980-8578, Japan JST, ERATO Nuclear Spin Electronics Project, Sendai 980-8578, Japan.

出版信息

Microscopy (Oxf). 2014 Dec;63(6):475-9. doi: 10.1093/jmicro/dfu028. Epub 2014 Aug 21.

DOI:10.1093/jmicro/dfu028

PMID:25145648

Abstract

We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.

摘要

我们已经开发出一种在环境条件下进行原子力显微镜（AFM）辅助扫描隧道谱（STS）的方法。在执行 STS 之前，AFM 功能用于快速定位到选定位置。在光谱测量过程中，AFM 反馈进一步用于抑制针尖 - 样品距离的垂直热漂移，从而能够在室温下进行灵活且稳定的光谱测量。