Poltorak Lukasz, Herzog Grégoire, Walcarius Alain
Laboratoire de Chimie Physique et Microbiologie pour l'Environnement (LCPME), UMR 7564, CNRS - Université de Lorraine, 405 rue de Vandoeuvre, 54600 Villers-les-Nancy, France.
Langmuir. 2014 Sep 30;30(38):11453-63. doi: 10.1021/la501938g. Epub 2014 Sep 17.
The electrochemically assisted generation of mesoporous silica deposits at arrays of microscopic liquid/liquid interfaces was investigated. Ion transfer voltammetry was used in order to initiate the formation of silica material by electrochemical transfer of template species (cetyltrimethylammonium, CTA(+)), initially present in the organic phase, to the aqueous phase containing the hydrolyzed silica precursors (tetraethoxysilane, TEOS). The deposition mechanism was investigated using cyclic voltammetry, based on the analysis of diffusion layer profiles of CTA(+) species from the organic side of the interface. The morphology of the deposits varied from hemispherical to almost flat with the potential scan rate, the spacing factor of the microinterfaces array supporting the liquid/liquid interfaces, or the initial CTA(+) and TEOS concentrations, as evidenced by scanning electron microscopy and profilometry analyses. The amount of deposited material can be related to the amount of CTA(+) species passing across the liquid/liquid interfaces. Confocal Raman spectroscopy was used to confirm the presence of surfactant-templated silica deposits and to analyze the effectiveness of calcination in removing the organic molecules filling the interior of the pores. After template removal, the mesoporous network became accessible to external reagents, as checked by interfacial alkylammonium cation transfer, suggesting a possible analytical interest of such modified micro-liquid/liquid interfaces.
研究了在微观液/液界面阵列上电化学辅助生成介孔二氧化硅沉积物的过程。使用离子转移伏安法,通过将最初存在于有机相中的模板物种(十六烷基三甲基铵,CTA(+))电化学转移到含有水解二氧化硅前驱体(四乙氧基硅烷,TEOS)的水相中,引发二氧化硅材料的形成。基于对界面有机侧CTA(+)物种扩散层分布的分析,使用循环伏安法研究了沉积机理。扫描电子显微镜和轮廓测量分析表明,沉积物的形态随电位扫描速率、支撑液/液界面的微界面阵列的间距因子或初始CTA(+)和TEOS浓度的变化而从半球形变为几乎平坦。沉积材料的量与穿过液/液界面的CTA(+)物种的量有关。共聚焦拉曼光谱用于确认表面活性剂模板化二氧化硅沉积物的存在,并分析煅烧去除填充孔内部有机分子的有效性。通过界面烷基铵阳离子转移检查发现,去除模板后,介孔网络对外部试剂变得可及,这表明这种修饰的微液/液界面可能具有分析价值。