1] International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China [2] Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany [3] Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China.
Nat Mater. 2014 Nov;13(11):1044-9. doi: 10.1038/nmat4087. Epub 2014 Sep 21.
Although the overall atomic structure of a nanoscale crystal is in principle accessible by modern transmission electron microscopy, the precise determination of its surface structure is an intricate problem. Here, we show that aberration-corrected transmission electron microscopy, combined with dedicated numerical evaluation procedures, allows the three-dimensional shape of a thin MgO crystal to be determined from only one single high-resolution image. The sensitivity of the reconstruction procedure is not only sufficient to reveal the surface morphology of the crystal with atomic resolution, but also to detect the presence of adsorbed impurity atoms. The single-image approach that we introduce offers important advantages for three-dimensional studies of radiation-sensitive crystals.
虽然现代透射电子显微镜在原则上可以获得纳米尺度晶体的整体原子结构,但精确确定其表面结构是一个复杂的问题。在这里,我们表明,结合专用数值评估程序的相衬校正透射电子显微镜允许仅从单个高分辨率图像确定薄氧化镁晶体的三维形状。重建过程的灵敏度不仅足以以原子分辨率揭示晶体的表面形态,还足以检测吸附杂质原子的存在。我们引入的单像方法为对辐射敏感晶体的三维研究提供了重要优势。