Mkhoyan K A, Batson P E, Cha J, Schaff W J, Silcox J
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
Science. 2006 Jun 2;312(5778):1354. doi: 10.1126/science.1124511.
With current advances in sub-angstrom resolution scanning transmission electron microscopy (STEM), it is now possible to image directly local crystal structures of materials where dramatically different atoms are separated from each other at distances about or less than 1 angstrom. We achieved direct imaging of atomic columns of nitrogen in close proximity to columns of aluminum in wurtzite aluminum nitride by using annular dark field imaging in an aberration-corrected STEM. This ability allows direct determination of the local polarity in nanoscale crystals and crystal defects.
随着目前亚埃分辨率扫描透射电子显微镜(STEM)技术的进步,现在有可能直接对材料的局部晶体结构进行成像,其中截然不同的原子在约1埃或小于1埃的距离彼此分离。我们通过在像差校正的STEM中使用环形暗场成像,实现了对纤锌矿型氮化铝中与铝柱紧邻的氮原子柱的直接成像。这种能力使得能够直接确定纳米级晶体中的局部极性和晶体缺陷。