Grieten Eva, Caen Joost, Schryvers Dominique
1EMAT,Department of Physics,University of Antwerp,Groeneborgerlaan 171,2020 Antwerp,Belgium.
2Research Group Heritage & Sustainability, Faculty of Design Sciences, Conservation Studies,University of Antwerp,Blindestraat 9, 2000 Antwerp,Belgium.
Microsc Microanal. 2014 Oct;20(5):1585-90. doi: 10.1017/S1431927614012860.
An alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.
一种替代的聚焦离子束制备方法用于对聚合物基质中含有金属纳米颗粒的历史照片进行取样。我们采用经典超薄切片术的制备步骤，并以聚焦离子束进行替代的最终切片。透射电子显微镜技术表明，薄片具有均匀的厚度，这是分析型透射电子显微镜的一个重要因素。此外，该方法保持了纳米颗粒在软基质中的空间分布。将结果与传统制备技术如超薄切片术和经典聚焦离子束铣削进行了比较。
