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表面活性剂包覆的ZnO纳米晶体的结构与光学特性合成

Synthesis of structural and optical characterization of surfactant capped ZnO nanocrystalline.

作者信息

Raja K, Ramesh P S, Geetha D, Kokila T, Sathiyapriya R

机构信息

Department of Physics, Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.

Department of Physics (DDE Wings), Annamalai University, Annamalai Nagar 608002, Tamil Nadu, India.

出版信息

Spectrochim Acta A Mol Biomol Spectrosc. 2015 Feb 5;136 Pt B:155-61. doi: 10.1016/j.saa.2014.08.092. Epub 2014 Sep 16.

Abstract

The presence of surfactant (CTAB) at three different concentrations viz., (0.5, 1 and 1.5 M) on zinc oxide (ZnO) nanocrystalline at 550°C was synthesized. The optical properties of each surfactant capped zinc oxide nanocrystalline were investigated using UV-Visible absorption. The characterization of these nanocrystalline was performed by X-ray diffractometer Spectrum (XRD), Scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS), and Atomic force microscopy (AFM) and Fourier transformer infrared (FTIR) spectroscopy. The effect of CTAB on the morphology of the ZnO was studied by SEM/EDS which revealed that the diameter of the product is in the range of 42-70 nm. Out of the three surfactant concentrations CTAB (0.5 M) capped zinc oxide nanoparticle has smallest crystalline size of 19.4 nm. Thus, the presence of surfactant on the surface of zinc oxide plays a significant role in reducing defect. The excitonic UV emission has been observed at 275 nm.

摘要

在550°C下合成了三种不同浓度(即0.5M、1M和1.5M)的表面活性剂(十六烷基三甲基溴化铵,CTAB)包覆的氧化锌(ZnO)纳米晶体。使用紫外可见吸收光谱研究了每种表面活性剂包覆的氧化锌纳米晶体的光学性质。通过X射线衍射光谱(XRD)、带有能谱仪(EDS)的扫描电子显微镜(SEM)、原子力显微镜(AFM)和傅里叶变换红外(FTIR)光谱对这些纳米晶体进行了表征。通过SEM/EDS研究了CTAB对ZnO形貌的影响,结果表明产物的直径在42-70nm范围内。在三种表面活性剂浓度中,CTAB(0.5M)包覆的氧化锌纳米颗粒具有最小的晶体尺寸,为19.4nm。因此,表面活性剂在氧化锌表面的存在对减少缺陷起着重要作用。在275nm处观察到了激子紫外发射。

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