Wang Yongming, Wakasugi Takenobu, Isobe Shigehito, Hashimoto Naoyuki, Ohnuki Somei
Creative Research Institution of Hokkaido University, N21W10, North Ward, Sapporo 001-0021, Japan
Graduate School of Engineering, Hokkaido University, N13-W8, North Ward, Sapporo 060-8628, Japan.
Microscopy (Oxf). 2014 Dec;63(6):437-47. doi: 10.1093/jmicro/dfu034. Epub 2014 Oct 6.
Transmission electron microscope (TEM) observation of light metal hydrides is complicated by the instability of these materials under electron irradiation. In this study, the electron kinetic energy dependences of the interactions of incident electrons with lithium, sodium and magnesium hydrides, as well as the constituting element effect on the interactions, were theoretically discussed, and electron irradiation damage to these hydrides was examined using in situ TEM. The results indicate that high incident electron kinetic energy helps alleviate the irradiation damage resulting from inelastic or elastic scattering of the incident electrons in the TEM. Therefore, observations and characterizations of these materials would benefit from increased, instead decreased, TEM operating voltage.
轻金属氢化物在电子辐照下不稳定，这使得通过透射电子显微镜（TEM）对其进行观察变得复杂。在本研究中，从理论上讨论了入射电子与氢化锂、氢化钠和氢化镁相互作用的电子动能依赖性，以及构成元素对相互作用的影响，并使用原位TEM研究了这些氢化物的电子辐照损伤。结果表明，高入射电子动能有助于减轻TEM中入射电子非弹性或弹性散射造成的辐照损伤。因此，提高而非降低TEM工作电压将有助于对这些材料进行观察和表征。
