IBM Thomas J. Watson Research Center , Yorktown Heights, New York 10598, United States.
Nano Lett. 2014 Nov 12;14(11):6414-7. doi: 10.1021/nl502928y. Epub 2014 Oct 15.
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics. In this letter, we investigate a multilayer black phosphorus photodetector that is capable of acquiring high-contrast (V > 0.9) images both in the visible (λVIS = 532 nm) as well as in the infrared (λIR = 1550 nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain. In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with submicron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.
黑磷是一种层状半导体，由于在光电子学中的应用而受到广泛研究。在这封信中，我们研究了一种多层黑磷光电探测器，该探测器能够在可见（λVIS = 532nm）和红外（λIR = 1550nm）光谱范围内获取高对比度（V>0.9）的图像。在第一步中，我们通过使用光电流显微镜来映射器件的有效区域，并对响应率和增益进行了表征。在第二步中，我们将黑磷器件作为一个点状探测器部署在共焦显微镜设置中，以亚微米分辨率获取具有衍射极限的光学图像。结果表明，黑磷作为一种光电材料，在高光谱成像应用中具有实用性。
