高能量同步辐射光源的无损微结构分析 X 射线成像
X-ray imaging for non-destructive microstructure analysis at SSRF.
机构信息
Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai, 201204, China.
出版信息
Adv Mater. 2014 Dec 10;26(46):7688-91. doi: 10.1002/adma.201402956. Epub 2014 Oct 15.
PMID:25319475
Abstract
The X-ray imaging beamline at the Shanghai Synchrotron Radiation Facility is aimed at developing and evaluating the effectiveness of synchrotron radiation (SR)-based imaging techniques in planar or computed tomography modalities. Several X-ray imaging methods are in use and find extensive applications in many research fields. In this Essay, the status of the methodology development at the beamline is discussed and applications are reviewed.
摘要
上海同步辐射装置的 X 射线成像光束线旨在开发和评估基于同步辐射（SR）的成像技术在平面或计算机层析成像模式中的有效性。目前有几种 X 射线成像方法正在使用，并在许多研究领域得到了广泛的应用。本文讨论了光束线上方法学发展的现状，并回顾了其应用。
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