Walter Schottky Institut & Physik Department, Technische Universität München , D-85748 Garching, Germany.
ACS Nano. 2014 Nov 25;8(11):11440-6. doi: 10.1021/nn504512u. Epub 2014 Nov 6.
We use low-temperature microphotoluminescence and photoluminescence excitation spectroscopy to measure the valence band parameters of single wurtzite InGaAs nanoneedles. The effective indium composition is measured by means of polarization-dependent Raman spectroscopy. We find that the heavy-hole and light-hole splitting is ∼95 meV at 10 K and the Stokes shift is in the range of 35-55 meV. These findings provide important insight in the band structure of wurtzite InGaAs that could be used for future bandgap engineering.
我们使用低温微光致发光和光致发光激发光谱法来测量单尖晶石 InGaAs 纳米针的价带参数。通过偏振相关拉曼光谱法来测量有效铟组成。我们发现,在 10 K 时重空穴和轻空穴分裂约为 95 meV,斯托克斯位移在 35-55 meV 范围内。这些发现为纤锌矿 InGaAs 的能带结构提供了重要的见解,可用于未来的能带工程。