Busold S, Philipp K, Otten A, Roth M
GSI Helmholtzzentrum für Schwerionenforschung, Planckstraße 1, 64291 Darmstadt, Germany.
Institus für Kernphysik, Technische Universität Darmstadt, Schlossgartenstraße 9, 64289 Darmstadt, Germany.
Rev Sci Instrum. 2014 Nov;85(11):113306. doi: 10.1063/1.4902321.
We report on the characterization of an image plate and its absolute calibration to electrons in the low keV energy range (1-30 keV). In our case, an Agfa MD4.0 without protection layer was used in combination with a Fuji FLA7000 scanner. The calibration data are compared to other published data and a consistent picture of the sensitivity of image plates to electrons is obtained, which suggests a validity of the obtained calibration up to 100 keV.
我们报告了一种成像板的特性及其在低keV能量范围（1 - 30 keV）内对电子的绝对校准。在我们的实验中，使用了没有保护层的爱克发MD4.0成像板，并与富士FLA7000扫描仪结合使用。将校准数据与其他已发表的数据进行比较，得到了成像板对电子灵敏度的一致情况，这表明所获得的校准在高达100 keV时是有效的。
