Ewing K J, Gibson D, Sanghera J, Miklos F
Naval Research Laboratory, Infrared Materials and Devices, Code 5620, 4555 Overlook Ave, SW, Washington DC20375, USA.
Naval Research Laboratory, Infrared Materials and Devices, Code 5620, 4555 Overlook Ave, SW, Washington DC20375, USA.
Anal Chim Acta. 2015 Jan 1;853:368-374. doi: 10.1016/j.aca.2014.09.042. Epub 2014 Sep 28.
The collection of a low vapor pressure chemical simulant triethyl phosphate sorbed onto silica gel (TEP/SG) from a surface with subsequent analysis of the TEP/SG particulates using desorption electrospray ionization-mass spectrometry (DESI-MS) is described. Collection of TEP/SG particulates on a surface was accomplished using a sticky screen sampler composed of a stainless steel screen coated with partially polymerized polydimethylsiloxane (PDMS). DESI-MS analysis of TEP/SG particulates containing different percentages of TEP sorbed onto silica gel enabled the generation of response curves for the TEP ions m/z 155 and m/z 127. Using the response curves the calculation of the mass of TEP in a 25 wt% sample of TEP/SG was calculated, results show that the calculated mass of TEP was 14% different from the actual mass of TEP in the sample using the m/z 127 TEP ion response curve. Detection limits for the TEP vapor and TEP/SG particulates were calculated to be 4 μg and 6 particles, respectively.
