Uhlemann Stephan, Müller Heiko, Zach Joachim, Haider Max
CEOS Corrected Electron Optical Systems GmbH, Englerstraße28, 69126 Heidelberg, Germany.
CEOS Corrected Electron Optical Systems GmbH, Englerstraße28, 69126 Heidelberg, Germany.
Ultramicroscopy. 2015 Apr;151:199-210. doi: 10.1016/j.ultramic.2014.11.022. Epub 2014 Nov 29.
Thermal magnetic field noise from magnetic and non-magnetic conductive parts close to the electron beam recently has been identified as a reason for decoherence in high-resolution transmission electron microscopy (TEM). Here, we report about new experimental results from measurements for a layered structure of magnetic and non-magnetic materials. For a simplified version of this setup and other situations we derive semi-analytical models in order to predict the strength, bandwidth and spatial correlation of the noise fields. The results of the simulations are finally compared to previous and new experimental data in a quantitative manner.
