Institute of Physical and Theoretical Chemistry, University of Tübingen , Auf der Morgenstelle 18, D-72076 Tübingen, Germany.
ACS Appl Mater Interfaces. 2015 Jan 28;7(3):1685-92. doi: 10.1021/am508854u. Epub 2015 Jan 13.
Thin film processes of organic radicals remain widely unknown, although these materials may have a significant technological potential. In aiming at their use in applications, we explore the electronic structure of thin films of a nitronyl nitroxide radical attached to a fluorophore core. According to our findings, this molecule maintains its radical function and, consequently, its sensing capabilities in the thin films. The films are characterized by a high structural degree of the molecular arrangement, coupled to strong vacuum and air stability that make this fluorophore-nitroxide radical an extremely promising candidate for application in electronics. Our work also identifies a quantitative correlation between the results obtained by the simultaneous use of X-ray photoemission and electron paramagnetic resonance spectroscopy. This result can be used as a standard diagnostic tool in order to link the (in situ-measured) electronic structure with classical ex situ paramagnetic investigations.
有机自由基的薄膜工艺仍然知之甚少，尽管这些材料可能具有重大的技术潜力。为了将其应用于实际，我们研究了连接在荧光团核心上的硝酰氮自由基的薄膜的电子结构。根据我们的发现，这种分子保持其自由基功能，从而保持其在薄膜中的传感能力。薄膜具有高的分子排列结构度，加上对真空和空气的稳定性，这使得这种荧光团-氮氧自由基成为电子学应用中极有前途的候选者。我们的工作还确定了同时使用 X 射线光电子能谱和电子顺磁共振波谱所获得的结果之间的定量相关性。这一结果可用作标准诊断工具，将（原位测量的）电子结构与经典的非原位顺磁共振研究联系起来。
