You Shangting, Kuang Cuifang, Rong Zihao, Liu Xu, Ding Zhihua
Appl Opt. 2014 Nov 20;53(33):7838-44. doi: 10.1364/AO.53.007838.
Fluorescence emission diffraction microscopy (FED) has proven to be an effective sub-diffraction-limited imaging method. In this paper, we theoretically propose a method to further enhance the resolving capability of FED. Using a coated mirror and only one objective lens, this method achieves not only the same axial resolution as 4Pi microscopy but also a higher lateral resolution. The point spread function (PSF) of our method is isotropic. According to calculations, the full width at half-maximum (FWHM) of the isotropic FED's PSF is 0.17λ along all three spatial directions. Compared with confocal microscopy, the lateral resolution is improved 0.7-fold, and the axial resolution is improved 3.1-fold. Simulation tests also demonstrate this method's advantage over traditional microscopy techniques.
荧光发射衍射显微镜(FED)已被证明是一种有效的亚衍射极限成像方法。在本文中,我们从理论上提出了一种进一步提高FED分辨能力的方法。该方法使用镀膜镜和仅一个物镜,不仅实现了与4Pi显微镜相同的轴向分辨率,还具有更高的横向分辨率。我们方法的点扩散函数(PSF)是各向同性的。据计算,各向同性FED的PSF在所有三个空间方向上的半高宽(FWHM)均为0.17λ。与共聚焦显微镜相比,横向分辨率提高了0.7倍,轴向分辨率提高了3.1倍。模拟测试也证明了该方法相对于传统显微镜技术的优势。