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电场诱导的LaAlO3/SrTiO3异质结构中阈值电压的变化

Electric-field-induced shift in the threshold voltage in LaAlO3/SrTiO3 heterostructures.

作者信息

Kim Seong Keun, Kim Shin-Ik, Lim Hyungkwang, Jeong Doo Seok, Kwon Beomjin, Baek Seung-Hyub, Kim Jin-Sang

机构信息

1] Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul 136-791, South Korea [2] Department of Nanomaterials Science and Technology, Korea University of Science and Technology, Daejeon, 305-333, Republic of Korea.

1] Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul 136-791, South Korea [2] Department of Materials Science and Engineering, Seoul National University, Seoul, 151-744, South Korea.

出版信息

Sci Rep. 2015 Jan 26;5:8023. doi: 10.1038/srep08023.

DOI:10.1038/srep08023
PMID:25620684
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4306114/
Abstract

The two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 and SrTiO3 is intriguing both as a fundamental science topic and for possible applications in electronics or sensors. For example, because the electrical conductance of the 2DEG at the LaAlO3/SrTiO3 interface can be tuned by applying an electric field, new electronic devices utilizing the 2DEG at the LaAlO3/SrTiO3 interface could be possible. For the implementation of field-effect devices utilizing the 2DEG, determining the on/off switching voltage for the devices and ensuring their stability are essential. However, the factors influencing the threshold voltage have not been extensively investigated. Here, we report the voltage-induced shift of the threshold voltage of Pt/LaAlO3/SrTiO3 heterostructures. A large negative voltage induces an irreversible positive shift in the threshold voltage. In fact, after the application of such a large negative voltage, the original threshold voltage cannot be recovered even by application of a large positive electric field. This irreversibility is attributed to the generation of deep traps near the LaAlO3/SrTiO3 interface under the negative voltage. This finding could contribute to the implementation of nanoelectronic devices using the 2DEG at the LaAlO3/SrTiO3 interface.

摘要

绝缘的LaAlO₃与SrTiO₃界面处的二维电子气(2DEG),无论是作为一个基础科学课题,还是在电子学或传感器领域的潜在应用方面,都备受关注。例如,由于LaAlO₃/SrTiO₃界面处2DEG的电导率可通过施加电场来调节,利用LaAlO₃/SrTiO₃界面处2DEG的新型电子器件便有可能实现。对于利用2DEG的场效应器件而言,确定器件的开/关切换电压并确保其稳定性至关重要。然而,影响阈值电压的因素尚未得到广泛研究。在此,我们报道了Pt/LaAlO₃/SrTiO₃异质结构阈值电压的电压诱导偏移。大的负电压会导致阈值电压出现不可逆的正向偏移。事实上,在施加如此大的负电压后,即使施加很大的正电场,原始的阈值电压也无法恢复。这种不可逆性归因于在负电压下LaAlO₃/SrTiO₃界面附近产生了深陷阱。这一发现可能有助于利用LaAlO₃/SrTiO₃界面处的2DEG来实现纳米电子器件。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/3c4e812305d9/srep08023-f5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/7c5d2472d665/srep08023-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/317ff89470c7/srep08023-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/dc4114a1387f/srep08023-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/7e6a791f2c4d/srep08023-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/3c4e812305d9/srep08023-f5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/7c5d2472d665/srep08023-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/317ff89470c7/srep08023-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/dc4114a1387f/srep08023-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/7e6a791f2c4d/srep08023-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f3db/4306114/3c4e812305d9/srep08023-f5.jpg

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本文引用的文献

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