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利用片上光子探测器进行散粒噪声检测。

Detecting noise with shot noise using on-chip photon detector.

机构信息

Nanoelectronics Group, Service de Physique de l'Etat Condense, IRAMIS/DSM (CNRS UMR 3680), CEA Saclay, F-91191 Gif-sur-Yvette, France.

Semiconductor Physics group, Cavendish Laboratory, University of Cambridge, J.J. Thomson Avenue, Cambridge CB3 0HE, UK.

出版信息

Nat Commun. 2015 Jan 27;6:6130. doi: 10.1038/ncomms7130.

DOI:10.1038/ncomms7130
PMID:25625934
Abstract

The high-frequency radiation emitted by a quantum conductor presents a rising interest in quantum physics and condensed matter. However, its detection with microwave circuits is challenging. Here, we propose to use the photon-assisted shot noise for on-chip radiation detection. It is based on the low-frequency current noise generated by the partitioning of photon-excited electrons and holes, which are scattered inside the conductor. For a given electromagnetic coupling to the radiation, the photon-assisted shot noise response is shown to be independent on the nature and geometry of the quantum conductor used for the detection, up to a Fano factor, characterizing the type of scattering mechanism. Ordered in temperature or frequency range, from few tens of mK or GHz to several hundred of K or THz respectively, a wide variety of conductors can be used like Quantum Point Contacts (this work), diffusive metallic or semi-conducting films, graphene, carbon nanotubes and even molecule, opening new experimental opportunities in quantum physics.

摘要

量子导体发射的高频辐射在量子物理学和凝聚态物质领域引起了极大的关注。然而,用微波电路来检测这种辐射具有挑战性。在这里,我们提出使用光辅助散粒噪声进行片上辐射检测。它基于光子激发的电子和空穴的分割产生的低频电流噪声,这些电子和空穴在导体内部被散射。对于给定的与辐射的电磁耦合,光辅助散粒噪声响应被证明与用于检测的量子导体的性质和几何形状无关,直到一个特征散射机制类型的费诺因子。按照温度或频率范围进行排序,从几十毫开尔文或千兆赫到几百开尔文或太赫兹不等,各种各样的导体都可以被使用,如量子点接触(本工作)、扩散金属或半导体薄膜、石墨烯、碳纳米管,甚至分子,这为量子物理学开辟了新的实验机会。

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